NTM Delta
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A d v a n c e d I n s i t u E m i s s i v i t y I n d e p e n d e n t N o n - c o n t a c t T e m p e r a t u r e M o n i t o r
The NTM Delta is the only high accuracy and repeatability pyrometer
which incorporates both real-time same-point emissivity and temperature
measurement.
Its design is based on CI Semis well-known NTM500, with
thousands of installations worldwide. The Deltas rapid update rate and
small footprint make it ideal for demanding applications such as RTP.
The high sensitivity and broad dynamic range allow low minimum
temperatures to be accurately measured. Application- dependent
algorithms allow for subtraction of interfering background radiation.
The NTM Delta measures wafer temperatures in RTP, PVD, HDP-CVD, and
other processes.
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F e
a t u r e s a n d B e n e f i t s
- In situ, non-contact monitoring.
- Real-time, same point temperature and emissivity measurement and compensation.
- High sensitivity with a broad dynamic range to allow minimal temperature measurement.
- Smallest footprint available.
- Rapid update rate (up to 1,000 Hz) for closed loop control.
- Advanced communication protocols including LAN, RS232 and provision
for DeviceNet, along with standard analog and digital I/O.
- Background compensation customized to each OEM process environment.
- BIT (Built-In Test).
- Optional remote control unit with temperature display.
- Optional optical interfaces available, including remote optics.
- Advanced, user friendly s/w for set-up, calibration and data-logging.
| K e y S p e c i f i c a
t i o n s |
Temperature range:
Total Range 70șC - 2000șC
Different models available, optimized for specific applications.
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Accuracy |
| 70șC - 500șC |
±0.8șC
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| 500șC - 2000șC |
±0.15%T |
| Repeatability |
±0.2șC (typical) |
| Resolution: |
0.01șC |
| Update rate |
Up to 400 Hz (with emissivity)
Up to 1,000 Hz (without emissivity) |
| Communication |
RS232, Ethernet, provisions for Devicenet |
| dimensions
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213x100x46 mm (without fiber) |
Related articles
In-Situ calibration (articles) The use of temperature monitoring in advanced semiconductor industry processing (articles) THE UT/NIST/SA/ISMT THERMOMETRY TEST BED (articles)
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